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883B Screening  |  Hi-Rel Screening  |  Terminology
 

CUSTOM  HI-REL  SCREENING

When required by the customer, Xsis oscillators can be subjected to the following tests on a 100% basis. PDA for burn-in is in accordance with the requirements of MIL-PRF-55310 for class B products.

Non-Destructive Bond Pull MIL-STD-883, Method 2023  ( PDA = 2% or 1 wire whichever is greater )
Internal Visual MIL-STD-883, Method 2017, Class B
Stabilization Bake MIL-STD-883, Method 1008, Cond. C, 48 Hours Minimum
Temperature Cycling MIL-STD-883, Method 1010, Cond. C
Constant Acceleration MIL-STD-883, Method 2001, Cond. A, Y1 only, ( 5000 G )
Seal ( fine and gross leak ) MIL-STD-883, Method 1014
PIND MIL-STD-883, Method 2020, Cond. B
Radiographic MIL-STD-883, Method 2012
Electrical Tests MIL-PRF-55310, Class B
Burn-in +125 °C , Nominal Supply Voltage and Burn-in Load, 240 Hours Minimum
Electrical Tests MIL-PRF-55310, Class B

 

Xsis Electronics Inc.
12620 W. 63rd St., Shawnee, KS 66216
Tel. (913)631-0448  Fax (913)631-1170  Email
xsis@xsis.com